L. Pósa et al: Noise diagnostics of graphene interconnects for atomic-scale electronics
We have demonstrated that the advanced analysis of low-frequency noise measurements supplies a rich source of information on the controlled electrobreakdown process of graphene nanojunctions. Following the evolution of the relative noise amplitudes we were able to optimize the electrical breakdown protocol and to identify distinct regimes of the nanogap formation process. View on: MTMT: 32040083 | DOI: 10.1038/s41699-021-00237-w | REAL: 126052