Spectroellipsometric and ion beam analytical investigation of nanocrystalline diamond layers

2021-01-26T16:02:40+02:00January 26th, 2021|

Tivadar Lohner, P Csíkvári, Khánh Nguyen Quoc, S Dávid, Zsolt Endre Horváth, Péter Petrik, György Hárs THIN SOLID FILMS 0040-6090 2011 View on: MTMT: 1619736 | DOI: 10.1016/j.tsf.2010.12.061 | WoS: 000289174200051 | Scopus: 79952627018