Latest News

Latest News2023-11-27T11:07:01+02:00

Presentation of László Pósa and Tímea Török on the 16th International Conference on Nanostructrured Materials (NANO) in Sevilla, Spain

June 10th, 2022|

Pósa L.: Tunable stochasticity in SiOx phase change memory devices; Török T.: Quantum Transport Phenomena in Transition Metal Oxide Memristors; NANO 2022

3rd Prize on TDK

November 23rd, 2021|

Our TDK student, Péter Hornung received 3rd Prize on the Annual Scientific Student Associations' Conference at BME (TDK) Title: Optimization of termoelectric acceleration sensor operating conditions Supervisor:  Dr. Szabolcs Berezvai, Dr. János Volk Section: Applied Mechanics Paper: https://tdk.bme.hu/GPK/AKM24/Autonom-termoelektromos-gyorsulasmero-szenzor Congratulations.

Z. Baji et al: Atomic layer deposition and characterization of Zn-doped Ga2O3 films

July 23rd, 2021|

The present work focuses on the atomic layer deposition (ALD), annealing, and Zn doping of gallium oxide (Ga2O3) films using a novel Ga precursor, hexakis-dimethylamino-digallium. As ALD deposited Ga2O3 films are always amorphous, the optimal annealing procedure had to be found to achieve crystalline beta -Ga2O3. The bandgaps and dielectric properties of the layers were measured and the effects of the deposition parameters and postdeposition annealing on the [...]

L. Pósa et al: Noise diagnostics of graphene interconnects for atomic-scale electronics

May 26th, 2021|

We have demonstrated that the advanced analysis of low-frequency noise measurements supplies a rich source of information on the controlled electrobreakdown process of graphene nanojunctions. Following the evolution of the relative noise amplitudes we were able to optimize the electrical breakdown protocol and to identify distinct regimes of the nanogap formation process. View on: MTMT: 32040083 | DOI: 10.1038/s41699-021-00237-w | REAL: 126052

1st Prize on OTDK

April 26th, 2021|

Our TDK student, Zsolt Filep received 1st Prize on National Scientific Students’ Associations Conference (OTDK). Title: 2-dimensional electron gas based energy harvesters. Supervisors: Dr. János Volk, Dr. István Endre Lukács Section Metrology Instuments 2 Congratulations.

3rd Prize on OTDK

April 26th, 2021|

Our TDK student, János Márk Bozorádi received 3rd Prize on the National Scientific Students’ Associations Conference (OTDK). Title: Improvement of measurement tools for piezoelectric energy harvesters Supervisor: Dr. János Radó Section: Metrology Instuments 3 Congratulations.

Binderiya’s award on OTDK

April 9th, 2021|

Our MSc student, Oyunbolor Binderiya received Special Award on the Materials Physics Section of the National Scientific Students’ Associations Conference (OTDK). Her supervisor is Dr. Nguyen Quoc Khánh and the title of the paper is: Reactive magnetron sputtering of AlN and AlScN thin films for piezoelectric applications. Congratulations.

Press release on the final results of the wireless sensor project (KoFAH) is published on various sites.

March 24th, 2021|

ek-cer.hu: Novel wireless sensor networks developed by researchers at EK MFA elektro-net.hu: Önellátó érzékelőhálózatok nehezen elérhető helyekre index.hu: Önellátó érzékelőhálózatokat terveztek az EK kutatói elkh.org: Új technológiákon alapuló önellátó érzékelőhálózatokat terveztek az EK kutatói ek-cer.hu: Új technológiákon alapuló önellátó érzékelőhálózatokat terveztek az EK kutatói

L. Pósa et al: A Rational Fabrication Method for Low Switching-Temperature VO2

January 15th, 2021|

…published in MDPI Nanomaterials (link) by the Nanosensors Group in cooperation with other MFA teams Here, we propose and optimize a simple fabrication method for VO2 rich layers by the oxidation of metallic vanadium in atmospheric air. It was shown that a sufficiently broad annealing time window of 3.0–3.5 h can be obtained at an optimal oxidation temperature of 400 °C. [...]

N. Q. Khánh et al: The effect of substrate bias on the piezoelectric properties of pulse DC magnetron sputtered AlN thin films

November 13th, 2020|

We have shown by Piezoresponse Force Microscopy (PFM) that the quality of the deposited AlN layer depends strongly on the negative substrate bias, i.e., the energy transferred via the bombardment of the accelerated positive ions on the sample. November 13 2020: N. Q. Khánh et al: The effect of substrate bias on the piezoelectric properties of pulse DC magnetron sputtered AlN thin films published in Journal of Materials [...]

Go to Top