We have shown by Piezoresponse Force Microscopy (PFM) that the quality of the deposited AlN layer depends strongly on the negative substrate bias, i.e., the energy transferred via the bombardment of the accelerated positive ions on the sample. November 13 2020: N. Q. Khánh et al: The effect of substrate bias on the piezoelectric properties of pulse DC magnetron sputtered AlN thin films published in Journal of Materials [...]

…have been awarded a certificate of merit at the Experimental Physics Session of BME TDK. Binderiya Oyunbolor (supervisor: Nguyen Quoc Khánh), Reactive magnetron sputtering of AlN and ScAlN thin films for piezoelectric applications Zsolt Filep (supervisor: István Endre Lukács), Two-dimensional electron gas based electromechanical microsensors A well-deserved congratulation to all of them!

Results were presented by the internal and external stakeholders of the project (KoFAH: Advanced Functional Materials for Autonomous Sensor Networks). Oral lectures were followed by a live demonstration of the developed systems.

Nanosensors Group performed several tire sensor tests in collaboration with the Institute for Computer Science and Control (SzTAKI). If you are interested in our driving assistance tire sensor concept please contact our group (contact at nems dot hu).

In the frame of the DoziNet project it was demonstrated that the radiation detector system developed by the Space Research Laboratory for sounding rocket experiments could be combined with the communication units and protocol used and developed by the Nanosensors Department for self-organizing scalable networks and that the combined system could be integrated into the network of Geiger–Müller (GM) probes installed and operated by the Environmental Protection Service [...]

April 28 2020: S. Soleimani et al: Optimization of co‑sputtered CrxAl1−xN thin films for piezoelectric MEMS devices published in Journal of Materials Science: Materials in Electronics 0957-4522 1573-482X View on: MTMT: 31308883 | DOI: 10.1007/s10854-020-03260-7 | REAL: 108669 | WoS: 000529837900002 | Scopus: 85083968123